Scanning Probe Microscope
Location, Scanning Probe MicroscopyA Digital Instruments MMAFM-2 scanning probe microscope is available for surface characterization.
By Location
- Stanford University (8)
- UC Davis (3)
Equipment Categories
- Available for Public Use (2)
- Coatings/Film Fabrication (1)
- Materials Processing/Preparation (3)
- Mechanical Testing (1)
- Microfabrication / Microelectronics / Clean Room (2)
- Optical Microscopy (2)
- Polymer Synthesis/Characterization (12)
- Powder Synthesis and Characterization (3)
- Scanning Probe Microscopy (1)
- Surface Preparation/Characterization (7)
- Thermal/Mechanical Analysis (2)
- Thin Film Fabrication and Characterization (8)
