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Surface Preparation/Characterization Facilities

  • Atomic force microscope/scanning tunneling microscope

    A Digital Instruments MultiMode atomic force microscope/scanning tunneling microscope (AFM/STM) is located at UC Davis. This instrument is available for use by regular users.

  • Near field scanning optical microscope

    A near field scanning optical microscope (NSOM) is located at UC Davis. This instrument is available for use by regular users.

  • Quartz Crystal Microbalance Sensor

    The quartz crystal microbalance (QCM) sensor has recently been put into place in the Stanford CPIMA Shared Facilities and is experiencing a surge of use. This sensor is extraordinarily sensitive to mass changes associated with the deposition of material onto the surface of a quartz crystal. These changes are sensed as changes in the natural resonant frequency of the QCM.
    Four Sensors on site.
    Models include a Q-Sense D300 analyzer, a Q-Sense E4 QCM-D multichannel analyzer, and a Maxtek RQCM analyzer.

  • Quasi-elastic light scattering apparatus

    A Brookhaven Instruments quasi-elastic light scattering apparatus is available for materials characterization at UC Davis. This instrument is available for use by regular users.

  • Quasi-elastic light scattering apparatus

    A Brookhaven Instruments quasi-elastic light scattering apparatus is available for materials characterization at Stanford.

  • Spectroscopic ellipsometer

    A Woollam spectroscopic ellipsometer is available at UC Davis for characterization of films and surfaces. This instrument is available for use by regular users.

  • Surface Plasmon Spectrometer

    Two surface plasmon spectrometers are available for surface characterization at UC Davis. These instruments are available for use by regular users.