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Location Facilities
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Atomic force microscope/scanning tunneling microscope
A Digital Instruments MultiMode atomic force microscope/scanning tunneling microscope (AFM/STM) is located at UC Davis. This instrument is available for use by regular users.
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Compensated Phase Locked Oscillator (CPLO)
Seok-Won Lee and W.D. Hinsberg at the IBM Almaden Research Laboratory, working with K. Kanazawa at Stanford University have used a Compensated Phase Locked Oscillator (CPLO) to measure the frequency and resistance changes following the immersion of a lithographic polymer into a solvent. The experimental points are shown as the red circles in the figure below. In accordance with a model proposed by Hinsberg and Lee where a thin gel layer is formed at the film/liquid interface, the predictions of the physical theory are shown by the solid blue line. This example shows the value of having proper QCM instrumentation for capturing accurate empirical data and the value of having a method by which data can be compared to a theoretical model
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Contact Angle Analyzer
An FTA 2000 contact angle analyzer is available for surface characterization.
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Dielectric/Impedance Analyzer
Two different dielectric/iimpedance analyzers are available for use with the quartz crystal microbalance analyzers. Hewlett-Packard 35670 Dielectric Analyzer.
Agilent 4294A Impedance Analyzer. -
Differential Scanning Calorimeter
A TA Instruments Q100 differential scanning calorimeter is available for thermal analysis of materials.
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Fluorescence Microscope
A Nikon Eclipse TE 2000-U fluorescence is available for thin film characterization.
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FTIR Spectrophotometer
A Perkin Elmer Spectrum 2000 is available for characterization of thin films, liquids, and powders. A grazing incidence accessory and an horizontal ATR accessory are available for use with this instrument.
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Genetic Analyzer
The ABI PRISM® 310 Genetic Analyzer is an automated single-capillary genetic analyzer designed for a wide range of sequencing and fragment analysis applications.
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Imaging Ellipsometer
An Accurion EP-3 imaging ellipsometer is available for characterization of thin films. A Langmuir-Blodgett trough accessor is also available for characterization of films formed at the water-air interface. A flow cell accessory can be used with this instument as well.
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Langmuir-Blodgett Trough
A KSV 2000 Langmuir-Blodgett trough is available for thin film fabrication.
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Mechanical Tester
An Instron 5844 mechanical tester is available for measuring the mechanical properties of materials. It is currently being used extensively in the testing of artificial cornea hydrogels. BioPulse bath and grip instrumentation is available for testing materials in an aqueous environment.
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Microfabrication Facility at UC Davis
The microfabrication facility, run by the Department of Electrical and Computer Engineering at UC Davis, is available to CPIMA members via subcontract.
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Millipore Nanopure Water System
A Millipore Nanopure water system produces ion-free water for use in materials processing, cleaning, and film fabrications.
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Near field scanning optical microscope
A near field scanning optical microscope (NSOM) is located at UC Davis. This instrument is available for use by regular users.
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Plasma cleaner
A Gabler Labor Instrumente Plasma Prep5 plasma cleaner is available for substrate cleaning before and during processing. This system can generate plasmas with air, oxygen, argon, or any other non-reactive gas. Organic samples may not be used in this system.
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Plasma Etcher
A Technics Micro RIE 800-II parallel plate electrode plasma etcher is available for substrate and materials cleaning. This plasma etcher is dedicated to use with organic materials.
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Quartz Crystal Microbalance Sensor
The quartz crystal microbalance (QCM) sensor has recently been put into place in the Stanford CPIMA Shared Facilities and is experiencing a surge of use. This sensor is extraordinarily sensitive to mass changes associated with the deposition of material onto the surface of a quartz crystal. These changes are sensed as changes in the natural resonant frequency of the QCM.
Four Sensors on site.
Models include a Q-Sense D300 analyzer, a Q-Sense E4 QCM-D multichannel analyzer, and a Maxtek RQCM analyzer. -
Quasi-elastic light scattering apparatus
A Brookhaven Instruments quasi-elastic light scattering apparatus is available for materials characterization at UC Davis. This instrument is available for use by regular users.
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Quasi-elastic light scattering apparatus
A Brookhaven Instruments quasi-elastic light scattering apparatus is available for materials characterization at Stanford.
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Scanning Probe Microscope
A Digital Instruments MMAFM-2 scanning probe microscope is available for surface characterization.
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Spectroscopic ellipsometer
A Woollam spectroscopic ellipsometer is available at UC Davis for characterization of films and surfaces. This instrument is available for use by regular users.
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Stanford Center for Integrated Systems
Access to major nanofabrication facilities of the Stanford Center for Integrated Systems is provided to CPIMA members.
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Stress Rheometer
TA Instruments AR2000ex Rheometer. The design of this instrument includes a uniques an ultra-low inertia drag cup motor and porous carbon air bearings for outstanding controlled stress, direct strain and controlled rate performance. The AR2000ex features an original quick-interchanging and self-configuring environmental system. The high resolution optical encoder, high stiffness low inertia design make the AR2000ex extremely versatile and appropriate for a wide variety of applications including characterization of delicate structures in fluides of any viscosity, polymer melts, solids, and reactive materials.
